
LM4040
SLOS456K – JANUARY 2005 – REVISED MARCH 2008 .................................................................................................................................................. www.ti.com
LM4040x30Q Electrical Characteristics
at extended temperature range, full-range T A = –40°C to 125°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
T A
LM4040C30Q
MIN TYP MAX
LM4040D30Q
MIN TYP MAX
UNIT
V Z
Reverse breakdown voltage
I Z = 100 μ A
25°C
3
3
V
Δ V Z
I Z,min
Reverse breakdown voltage
tolerance
Minimum cathode current
I Z = 100 μ A
25°C
Full range
25°C
Full range
–15
–45
47
15
45
77
82
–30
–75
47
30
75
77
82
mV
μ A
I Z = 10 mA
25°C
±20
±20
α VZ
Average temperature coefficient
of reverse breakdown voltage
I Z = 1 mA
25°C
Full range
±15
±100
±15
±150
ppm/°C
I Z = 100 μ A
25°C
±15
±15
D V Z
D I Z
Z Z
e N
Reverse breakdown voltage
change with cathode current
change
Reverse dynamic impedance
Wideband noise
I Z,min < I Z < 1 mA
1 mA < I Z < 15 mA
I Z = 1 mA, f = 120 Hz,
I AC = 0.1 I Z
I Z = 100 μ A,
10 Hz ≤ f ≤ 10 kHz
25°C
Full range
25°C
Full range
25°C
25°C
0.4
2.7
0.4
35
0.8
1.1
6
9
0.9
0.4
2.7
0.4
35
1.1
1.3
8
11
1.2
mV
?
μ V RMS
Long-term stability of reverse
breakdown voltage
t = 1000 h,
T A = 25°C ± 0.1°C,
I Z = 100 μ A
120
120
ppm
V HYST
Thermal hysteresis (1)
Δ T A = –40°C to 125°C
0.08
0.08
%
(1)
Thermal hysteresis is defined as V Z,25°C (after cycling to –40°C) – V Z,25°C (after cycling to 125°C).
16
Copyright ? 2005–2008, Texas Instruments Incorporated